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国際学会発表

1) T. Tadokoro, T.Fukazawa, and H.Toriumi: "Dynamic Response of a Liquid Crystal Analyzed by a Polarization Modulated Spectroscopic Polarimeter", 16th ILCC (1996) KENT, U.S.
2) T. Fukazawa, T. Tadokoro, and H. Toriumi: "Application of Spectroellipsometry to the Study of Liquid Crystal Reorientation Dynamics", ICSE-2 (1997) Charleston, U.S.
3) T. Akahane, M. Kimura, H. Toriumi, T. Fukazawa, T. Tadokoro: "4 x 4 Matrix Simulation of Liquid Crystal Reorientation Dynamics as Studied by Time-Resolved Spectroellipsometry", ICSE-2 (1997) Charleston, U.S.
4) T. Tadokoro, K. Akao, T. Akahane, M. Kimura, H. Toriumi: "Polarization Modulated Spectroellipsometry as a new tool for the Characterization of Liquid Crystal Surface Reorientation Dynamics", IDW '97 (1997) Nagoya, JAPAN.
5) H. Toriumi, T. Akahane, M. Kimura, T. Tadokoro, and K. Akao: "4 x 4 Matrix Simulation of Time-Resolved Spectroellipsometry Data on Liquid Crystal Surface Reorientation Dynamics", IDW '97 (1997) Nagoya, JAPAN.
6) T. Tadokoro, K. Akao, A. Mochizuki, T. Akahane, M. Kimura, and H. Toriumi: "Development of 20μs Time-Resolved Spectroellipsometry and Its Application to the study of Ferroelectric Liquid Crystals", 17th ILCC (1998) Strasbourg, FRANCE.
7) K. Akao, T. Tadokoro, S. Okutani, M. Kimura, T. Akahane, and H. Toriumi: "Quantitative Analyses of Surface Anchoring Effect by use of Polarization-Modulated Spectroellipsometry", 17th ILCC (1998) Strasbourg, FRANCE.
8) S. Okutani, M. Kimura, T. Akahane, H. Toriumi, T. Tadokoro, and K. Akao: "Investigation of Interfacial Liquid Crystal Orientation by Reflection Ellipsometry", 17th ILCC (1998) Strasbourg, FRANCE.
9) Y. Narita, T. Tadokoro, T. Ikeda, T. Saiki, S. Mononobe, M. Ohotsu: "Ultra-High Spatial Resolution Mapping Measurement of Polydiacetylene Using a Near-Field Raman Spectrometer", Pittcon '98 (1998) New Orleans, U.S.
10) S. Morino, Y. Shimizu, K. Ichimura, T. Tadokoro, T. Akahane, H. Toriumi: "Photoinitiated Reorientation Dynamics of Nematic Liquid Crystals on CommandSurfaces", OLC '99 (1999) Humacao, Perto Rico, I 3.5.
11) H. Toriumi, T. Tadokoro, T. Yoshihara, S. Okutani, M. Kimura, and T. Akahane: "Surface Dynamics in SSFLC as studied by Time-Resolved Spectroellipsometry", IDW '99 (1999) Sendai, JAPAN.
12) T. Tadokoro, T. Chisaka and Y. Hayashi: "Near-Infrared Interference Method as a Practical Cell Gap Measurement Tool for Reflective Color Liquid Crystal Displays", 18th ILCC (2000) Sendai, JAPAN, 25D-59-P, p.330.
13) T. Tadokoro, K. Akao, S. Okutani, M. Kimura, T. Akahane, and H. Toriumi: "Analysis of Optical Flickering Effect in Nematic Liquid Crystals using Total Reflection Time-Resolved Spectroellipsometry", 18th ILCC (2000) Sendai, JAPAN, 25D-60-P, p.331.
14) M. Kimura, S. Okutani, T. Churiki, T. Akahane, H. Toriumi, T. Tadokoro: "Determination of the birefringence, the twist angle and the thickness of the nematic liquid crystal sample by renormalized transmission ellipsometry", 18th ILCC (2000) Sendai, JAPAN, 24D-44-P, p.161.
15) S. Okutani, M. Kimura, H.Toriumi, K. Akao, T. Tadokoro and T. Akahane: "Analysis of Electrical Response of Nematic Liquid Crystal by Renormalized Ellipsometry", 18th ILCC (2000) Sendai, JAPAN, 24D-45-P, p.162.
16) T. Saiki, T. Tadokoro, H. Toriumi: "3-Dimensional Analysis of Liquid Crystal Surface Response Using a Scanning Near-Field Optical Microscope", 18th ILCC (2000) Sendai, JAPAN, 25A-1-I, p.44.
17) T. Tadokoro, T. Saiki and H. Toriumi: "Analysis of Liquid Crystal Response on Alignment Film Using Near-Field Scanning Optical Microscopy", NFO-6 (2000) Univ. of Twente, the Netherlands, MoP1, p.68.
18) H. Toriumi, T. Tadokoro and T. Saiki: "Visualization of Liquid Crystal Orientation at Substrate Surface by use of Scanning Near-Filed Optical Microscope", IDW '00 (2000) Kobe, JAPAN, pp.61-64.
19) T. Saiki, K. Yusu, and K. Ichihara and T. Tadokoro: "Reflection-Mode Operation of Near-Field Scanning Optical Microscope With Entirely Metal-Coated Probe", NFO-6 (2000) Univ. of Twente, the Netherlands, MoP55, p.122.
20) T. Igarashi, T. Tadokoro, K. Nakajima and T. Nishi: "Polarization observation of polymeric materials by novel polarized SNOM/AFM system", Japan-Korea Young Scientist Symposium(2007), Tokyo, Japan.
21) T. Igarashi, T. Tadokoro, K. Nakajima and T. Nishi: "Observation of polymeric materials by novel polarizing SNOM/AFM system", ICNP 2007(2007), Kottayam; Kerala, India.
22) T. Igarashi, T. Tadokoro, K. Nakajima and T. Nishi: "Polarized SNOM/AFM study on Polymeric materials", ICSPM15(2007), Shizuoka, Japan.
23) H. Oizumi, M. Saida, H. Sagami, K. Omote, Y. Mizobuchi, Y. Kasama, K. Yokoo, S. Ono and T. Tadokoro: "Noncontact Thickness Monitor of Organic and Molecular Films", The 35th F-NT Sympo. (2008), Tokyo, Japan, p.140.
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