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国際学会発表

24) Nathan Hagen, Toshiyasu Tadokoro, "The rainbow beam experiment: direct visualization of dipole scattering and optical rotatory dispersion," Proc. SPIE 11132, Polarization Science and Remote Sensing IX, 111320E (6 September 2019); doi: 10.1117/12.2526479.
23) H. Oizumi, M. Saida, H. Sagami, K. Omote, Y. Mizobuchi, Y. Kasama, K. Yokoo, S. Ono and T. Tadokoro: "Noncontact Thickness Monitor of Organic and Molecular Films", The 35th F-NT Sympo. (2008), Tokyo, Japan, p.140.
22) T. Igarashi, T. Tadokoro, K. Nakajima and T. Nishi: "Polarized SNOM/AFM study on Polymeric materials", ICSPM15(2007), Shizuoka, Japan.
21) T. Igarashi, T. Tadokoro, K. Nakajima and T. Nishi: "Observation of polymeric materials by novel polarizing SNOM/AFM system", ICNP 2007(2007), Kottayam; Kerala, India.
20) T. Igarashi, T. Tadokoro, K. Nakajima and T. Nishi: "Polarization observation of polymeric materials by novel polarized SNOM/AFM system", Japan-Korea Young Scientist Symposium(2007), Tokyo, Japan.
19) T. Saiki, K. Yusu, and K. Ichihara and T. Tadokoro: "Reflection-Mode Operation of Near-Field Scanning Optical Microscope With Entirely Metal-Coated Probe", NFO-6 (2000) Univ. of Twente, the Netherlands, MoP55, p.122.
18) H. Toriumi, T. Tadokoro and T. Saiki: "Visualization of Liquid Crystal Orientation at Substrate Surface by use of Scanning Near-Filed Optical Microscope", IDW '00 (2000) Kobe, JAPAN, pp.61-64.
17) T. Tadokoro, T. Saiki and H. Toriumi: "Analysis of Liquid Crystal Response on Alignment Film Using Near-Field Scanning Optical Microscopy", NFO-6 (2000) Univ. of Twente, the Netherlands, MoP1, p.68.
16) T. Saiki, T. Tadokoro, H. Toriumi: "3-Dimensional Analysis of Liquid Crystal Surface Response Using a Scanning Near-Field Optical Microscope", 18th ILCC (2000) Sendai, JAPAN, 25A-1-I, p.44.
15) S. Okutani, M. Kimura, H.Toriumi, K. Akao, T. Tadokoro and T. Akahane: "Analysis of Electrical Response of Nematic Liquid Crystal by Renormalized Ellipsometry", 18th ILCC (2000) Sendai, JAPAN, 24D-45-P, p.162.
14) M. Kimura, S. Okutani, T. Churiki, T. Akahane, H. Toriumi, T. Tadokoro: "Determination of the birefringence, the twist angle and the thickness of the nematic liquid crystal sample by renormalized transmission ellipsometry", 18th ILCC (2000) Sendai, JAPAN, 24D-44-P, p.161.
13) T. Tadokoro, K. Akao, S. Okutani, M. Kimura, T. Akahane, and H. Toriumi: "Analysis of Optical Flickering Effect in Nematic Liquid Crystals using Total Reflection Time-Resolved Spectroellipsometry", 18th ILCC (2000) Sendai, JAPAN, 25D-60-P, p.331.
12) T. Tadokoro, T. Chisaka and Y. Hayashi: "Near-Infrared Interference Method as a Practical Cell Gap Measurement Tool for Reflective Color Liquid Crystal Displays", 18th ILCC (2000) Sendai, JAPAN, 25D-59-P, p.330.
11) H. Toriumi, T. Tadokoro, T. Yoshihara, S. Okutani, M. Kimura, and T. Akahane: "Surface Dynamics in SSFLC as studied by Time-Resolved Spectroellipsometry", IDW '99 (1999) Sendai, JAPAN.
10) S. Morino, Y. Shimizu, K. Ichimura, T. Tadokoro, T. Akahane, H. Toriumi: "Photoinitiated Reorientation Dynamics of Nematic Liquid Crystals on CommandSurfaces", OLC '99 (1999) Humacao, Perto Rico, I 3.5.
9) Y. Narita, T. Tadokoro, T. Ikeda, T. Saiki, S. Mononobe, M. Ohotsu: "Ultra-High Spatial Resolution Mapping Measurement of Polydiacetylene Using a Near-Field Raman Spectrometer", Pittcon '98 (1998) New Orleans, U.S.
8) S. Okutani, M. Kimura, T. Akahane, H. Toriumi, T. Tadokoro, and K. Akao: "Investigation of Interfacial Liquid Crystal Orientation by Reflection Ellipsometry", 17th ILCC (1998) Strasbourg, FRANCE.
7) K. Akao, T. Tadokoro, S. Okutani, M. Kimura, T. Akahane, and H. Toriumi: "Quantitative Analyses of Surface Anchoring Effect by use of Polarization-Modulated Spectroellipsometry", 17th ILCC (1998) Strasbourg, FRANCE.
6) T. Tadokoro, K. Akao, A. Mochizuki, T. Akahane, M. Kimura, and H. Toriumi: "Development of 20μs Time-Resolved Spectroellipsometry and Its Application to the study of Ferroelectric Liquid Crystals", 17th ILCC (1998) Strasbourg, FRANCE.
5) H. Toriumi, T. Akahane, M. Kimura, T. Tadokoro, and K. Akao: "4 x 4 Matrix Simulation of Time-Resolved Spectroellipsometry Data on Liquid Crystal Surface Reorientation Dynamics", IDW '97 (1997) Nagoya, JAPAN.
4) T. Tadokoro, K. Akao, T. Akahane, M. Kimura, H. Toriumi: "Polarization Modulated Spectroellipsometry as a new tool for the Characterization of Liquid Crystal Surface Reorientation Dynamics", IDW '97 (1997) Nagoya, JAPAN.
3) T. Akahane, M. Kimura, H. Toriumi, T. Fukazawa, T. Tadokoro: "4 x 4 Matrix Simulation of Liquid Crystal Reorientation Dynamics as Studied by Time-Resolved Spectroellipsometry", ICSE-2 (1997) Charleston, U.S.
2) T. Fukazawa, T. Tadokoro, and H. Toriumi: "Application of Spectroellipsometry to the Study of Liquid Crystal Reorientation Dynamics", ICSE-2 (1997) Charleston, U.S.
1) T. Tadokoro, T.Fukazawa, and H.Toriumi: "Dynamic Response of a Liquid Crystal Analyzed by a Polarization Modulated Spectroscopic Polarimeter", 16th ILCC (1996) KENT, U.S.
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